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The company is a leading supplier of nanoprobing tools to the semiconductor industry. Nanoprobing is the method of measuring the world’s most advanced electronic devices, which are invisible to all but the most advanced microscopes.
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Manufacturer of the only multi-head Atomic Force nanoprober for semiconductor failure analysis.
Fault Isolation and Nanoprobing Capabilities Within a Single Tool Manufacturer of the Atomic Force The AFP is a high-resolution imaging and probing tool that electrically characterizes advanced

Date Added: Feb 16, 2011 Hits: Rating: 0.00 Votes: 0

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North Carolina State University, providing studies in instruments electron and scanned probe microscopy.
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The NCSU Analytical Instrumentation Facility (AIF) founded in 1923 as Engineering Research Services is a North Carolina State University resource for materials characterization. AIF operates a number
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Date Added: Feb 16, 2011 Hits: Rating: 0.00 Votes: 0

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Nanotechnology guide, events, resources, news, and links.
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A site listing various nanotechnology resources, definitions, etc.
Brad Hein's Nanotechnology Site | Forum | Message Boards | I've done some thinking since this site has been dormant for three years because of my lack of time. I'm going to keep the information on

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Undertakes modification of materials at atomic and nanometer scales and studies nano-electronic devices.
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IBM Research Center's Nanoscience Group website. Outlines our work on Carbon nanotubes, nanoelectronics, and local oxidation using an AFM or STM tip
Nanoscale science department Welcome to the website of the at the IBM T. J. Watson Research Center, Yorktown Heights, New York. Our group uses scanning tunneling microscopy (STM) and atomic force

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Manufactures scanning probes for scanning probe microscopy.
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Founded by Nanotechnology pioneer Dr. Olaf Ohlsson, Nanosensors heads the world market with its innovative high quality scanning probes for SPM (Scanning Probe Microscopy). For more than ten years
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